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ISL6612, ISL6613
Data Sheet February 26, 2007 FN9153.8
Advanced Synchronous Rectified Buck MOSFET Drivers with Protection Features
The ISL6612 and ISL6613 are high frequency MOSFET drivers specifically designed to drive upper and lower power N-Channel MOSFETs in a synchronous rectified buck converter topology. These drivers combined with HIP63xx or ISL65xx Multi-Phase Buck PWM controllers and N-Channel MOSFETs form complete core-voltage regulator solutions for advanced microprocessors. The ISL6612 drives the upper gate to 12V, while the lower gate can be independently driven over a range from 5V to 12V. The ISL6613 drives both upper and lower gates over a range of 5V to 12V. This drive-voltage provides the flexibility necessary to optimize applications involving trade-offs between gate charge and conduction losses. An advanced adaptive zero shoot-through protection is integrated to prevent both the upper and lower MOSFETs from conducting simultaneously and to minimize the dead time. These products add an overvoltage protection feature operational before VCC exceeds its turn-on threshold, at which the PHASE node is connected to the gate of the low side MOSFET (LGATE). The output voltage of the converter is then limited by the threshold of the low side MOSFET, which provides some protection to the microprocessor if the upper MOSFET(s) is shorted during startup. The overtemperature protection feature prevents failures resulting from excessive power dissipation by shutting off the outputs when its junction temperature exceeds +150C (typically). The driver resets once its junction temperature returns to +108C (typically). These drivers also feature a three-state PWM input which, working together with Intersil's multi-phase PWM controllers, prevents a negative transient on the output voltage when the output is shut down. This feature eliminates the Schottky diode that is used in some systems for protecting the load from reversed output voltage events.
Features
* Pin-to-pin Compatible with HIP6601 SOIC family for Better Performance and Extra Protection Features * Dual MOSFET Drives for Synchronous Rectified Bridge * Advanced Adaptive Zero Shoot-Through Protection - Body Diode Detection - Auto-zero of rDS(ON) Conduction Offset Effect * Adjustable Gate Voltage (5V to 12V) for Optimal Efficiency * 36V Internal Bootstrap Schottky Diode * Bootstrap Capacitor Overcharging Prevention * Supports High Switching Frequency (up to 2MHz) - 3A Sinking Current Capability - Fast Rise/Fall Times and Low Propagation Delays * Three-State PWM Input for Output Stage Shutdown * Three-State PWM Input Hysteresis for Applications With Power Sequencing Requirement * Pre-POR Overvoltage Protection * VCC Undervoltage Protection * Over Temperature Protection (OTP) with +42C Hysteresis * Expandable Bottom Copper Pad for Enhanced Heat Sinking * Dual Flat No-Lead (DFN) Package - Near Chip-Scale Package Footprint; Improves PCB Efficiency and Thinner in Profile * Pb-Free Plus Anneal Available (RoHS Compliant)
Applications
* Core Regulators for Intel(R) and AMD(R) Microprocessors * High Current DC/DC Converters * High Frequency and High Efficiency VRM and VRD
Related Literature
* Technical Brief TB363 "Guidelines for Handling and Processing Moisture Sensitive Surface Mount Devices (SMDs)" * Technical Brief TB417 for Power Train Design, Layout Guidelines, and Feedback Compensation Design
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CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures. 1-888-INTERSIL or 1-888-468-3774 | Intersil (and design) is a registered trademark of Intersil Americas Inc. Copyright Intersil Americas Inc. 2005, 2006, 2007. All Rights Reserved All other trademarks mentioned are the property of their respective owners.
ISL6612, ISL6613 Ordering Information
PART NUMBER ISL6612CB ISL6612CBZ (Note) ISL6612CBZA (Note) ISL6612CR ISL6612CRZ (Note) ISL6612ECB ISL6612ECBZ (Note) ISL6612EIB ISL6612EIBZ (Note) ISL6612IB ISL6612IBZ (Note) ISL6612IR ISL6612IRZ (Note) ISL6613CB ISL6613CBZ (Note) ISL6613CR ISL6613CRZ (Note) ISL6613ECB ISL6613ECBZ (Note) ISL6613EIB ISL6613EIBZ (Note) ISL6613IB ISL6613IBZ (Note) ISL6613IR ISL6613IRZ (Note) PART MARKING ISL66 12CB 6612 CBZ 6612 CBZ 612C 612Z ISL66 12ECB 6612 ECBZ ISL66 12EIB 6612 EIBZ ISL66 12IB 6612 IBZ 612I 12IZ ISL66 13CB 6613 CBZ 613C 613Z ISL66 13ECB 6613 ECBZ ISL66 13EIB 6613 EIBZ ISL66 13IB 6613 IBZ 613I 13IZ TEMP. RANGE (C) 0 to +85 0 to +85 0 to +85 0 to +85 0 to +85 0 to +85 0 to +85 -40 to +85 -40 to +85 -40 to +85 -40 to +85 -40 to +85 -40 to +85 0 to +85 0 to +85 0 to +85 0 to +85 0 to +85 0 to +85 -40 to +85 -40 to +85 -40 to +85 -40 to +85 -40 to +85 -40 to +85 8 Ld SOIC 8 Ld SOIC (Pb-Free) 8 Ld SOIC (Pb-Free) 10 Ld 3x3 DFN 10 Ld 3x3 DFN (Pb-Free) 8 Ld EPSOIC 8 Ld EPSOIC (Pb-Free) 8 Ld EPSOIC 8 Ld EPSOIC (Pb-Free) 8 Ld SOIC 8 Ld SOIC (Pb-Free) 10 Ld 3x3 DFN 10 Ld 3x3 DFN (Pb-Free) 8 Ld SOIC 8 Ld SOIC (Pb-Free) 10 Ld 3x3 DFN 10 Ld 3x3 DFN (Pb-Free) 8 Ld EPSOIC 8 Ld EPSOIC (Pb-Free) 8 Ld EPSOIC 8 Ld EPSOIC (Pb-Free) 8 Ld SOIC 8 Ld SOIC (Pb-Free) 10 Ld 3x3 DFN 10 Ld 3x3 DFN (Pb-Free) PACKAGE PKG. DWG. # M8.15 M8.15 M8.15 L10.3x3 L10.3x3 M8.15B M8.15B M8.15B M8.15B M8.15 M8.15 L10.3x3 L10.3x3 M8.15 M8.15 L10.3x3 L10.3x3 M8.15B M8.15B M8.15B M8.15B M8.15 M8.15 L10.3x3 L10.3x3
Add "-T" suffix for tape and reel. NOTE: Intersil Pb-free plus anneal products employ special Pb-free material sets; molding compounds/die attach materials and 100% matte tin plate termination finish, which are RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Intersil Pb-free products are MSL classified at Pb-free peak reflow temperatures that meet or exceed the Pb-free requirements of IPC/JEDEC J STD-020.
Pinouts
ISL6612CB, ISL6613CB (8 LD SOIC) ISL6612ECB, ISL6613ECB (8 LD EPSOIC) TOP VIEW
UGATE BOOT PWM GND 1 2 3 4 GND 8 7 6 5 PHASE PVCC VCC LGATE
ISL6612CR, ISL6613CR (10 LD 3x3 DFN) TOP VIEW
UGATE BOOT N/C PWM GND 1 2 3 4 5 GND 10 PHASE 9 PVCC 8 7 N/C VCC 6 LGATE
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FN9153.8 February 26, 2007
ISL6612, ISL6613 Block Diagram
ISL6612 AND ISL6613
UVCC VCC +5V 10k PWM POR/ CONTROL 8k LOGIC OTP AND PRE-POR OVP FEATURES
BOOT UGATE PHASE (LVCC) PVCC UVCC = VCC FOR ISL6612 UVCC = PVCC FOR ISL6613 LGATE
SHOOTTHROUGH PROTECTION
GND PAD FOR DFN AND EPSOIC-DEVICES, THE PAD ON THE BOTTOM SIDE OF THE PACKAGE MUST BE SOLDERED TO THE CIRCUIT'S GROUND.
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FN9153.8 February 26, 2007
ISL6612, ISL6613 Typical Application - 3 Channel Converter Using ISL65xx and ISL6612 Gate Drivers
+12V
+5V TO 12V
VCC PVCC ISL6612
BOOT UGATE PHASE
PWM
LGATE GND
+5V TO 12V
+12V
+5V VCC VFB VSEN PGOOD VCC COMP PVCC PWM1 PWM2 PWM3 LGATE MAIN CONTROL ISL65xx GND PWM ISL6612 UGATE PHASE BOOT +VCORE
VID
ISEN1 ISEN2 FS ISEN3 GND +5V TO 12V +12V
VCC PVCC ISL6612 PWM
BOOT UGATE PHASE
LGATE GND
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FN9153.8 February 26, 2007
ISL6612, ISL6613
Absolute Maximum Ratings
Supply Voltage (VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15V Supply Voltage (PVCC) . . . . . . . . . . . . . . . . . . . . . . . . . VCC + 0.3V Input Voltage (VPWM) . . . . . . . . . . . . . . . . . . . . . . GND - 0.3V to 7V BOOT Voltage (VBOOT-GND). . . . . . . . . . . . . . . . . . . . . . . . . . . .36V BOOT To PHASE Voltage (VBOOT-PHASE) . . . . . -0.3V to 15V (DC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -0.3V to 16V (<10ns, 10J) UGATE. . . . . . . . . . . . . . . . . . . VPHASE - 0.3VDC to VBOOT + 0.3V VPHASE - 3.5V (<100ns Pulse Width, 2J) to VBOOT + 0.3V LGATE . . . . . . . . . . . . . . . . . . . . . . GND - 0.3VDC to VPVCC + 0.3V GND - 5V (<100ns Pulse Width, 2J) to VPVCC + 0.3V PHASE. . . . . . . . . . . . . . . . . . . . . . . . . . . .GND - 0.3VDC to 15VDC GND - 8V (<400ns, 20J) to 30V (<200ns, VBOOT-GND < 36V) ESD Rating Human Body Model . . . . . . . . . . . . . . . . . . . . Class I JEDEC STD
Thermal Information
Thermal Resistance JA (C/W) JC (C/W) 8 Ld SOIC Package (Note 1) . . . . . . . . 100 N/A 8 Ld EPSOIC Package (Notes 2, 3). . . 50 7 10 Ld DFN Package (Notes 2, 3) . . . . . 48 7 Maximum Junction Temperature (Plastic Package) . . . . . . . +150C Maximum Storage Temperature Range . . . . . . . . . .-65C to +150C Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . +300C (SOIC - Lead Tips Only)
Recommended Operating Conditions
Ambient Temperature Range. . . . . . . . . . . . . . . . . . .-40C to +85C Maximum Operating Junction Temperature. . . . . . . . . . . . . +125C Supply Voltage, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . .12V 10% Supply Voltage Range, PVCC . . . . . . . . . . . . . . . . 5V to 12V 10%
CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES: 1. JA is measured with the component mounted on a high effective thermal conductivity test board in free air. 2. JA is measured in free air with the component mounted on a high effective thermal conductivity test board with "direct attach" features. See Tech Brief TB379. 3. For JC, the "case temp" location is the center of the exposed metal pad on the package underside.
Electrical Specifications
PARAMETER VCC SUPPLY CURRENT Bias Supply Current
Recommended Operating Conditions, Unless Otherwise Noted. SYMBOL TEST CONDITIONS MIN TYP MAX UNITS
IVCC
ISL6612, fPWM = 300kHz, VVCC = 12V ISL6613, fPWM = 300kHz, VVCC = 12V
-
7.2 4.5 11 5 2.5 5.2 7 13
-
mA mA mA mA mA mA mA mA
IVCC
ISL6612, fPWM = 1MHz, VVCC = 12V ISL6613, fPWM = 1MHz, VVCC = 12V
Gate Drive Bias Current
IPVCC
ISL6612, fPWM = 300kHz, VPVCC = 12V ISL6613, fPWM = 300kHz, VPVCC = 12V
IPVCC
ISL6612, fPWM = 1MHz, VPVCC = 12V ISL6613, fPWM = 1MHz, VPVCC = 12V
POWER-ON RESET AND ENABLE VCC Rising Threshold VCC Rising Threshold VCC Falling Threshold VCC Falling Threshold PWM INPUT (See "TIMING DIAGRAM" on page 7) Input Current IPWM VPWM = 5V VPWM = 0V PWM Rising Threshold PWM Falling Threshold Typical Three-State Shutdown Window Three-State Lower Gate Falling Threshold Three-State Lower Gate Rising Threshold Three-State Upper Gate Rising Threshold Three-State Upper Gate Falling Threshold Shutdown Holdoff Time tTSSHD VCC = 12V VCC = 12V VCC = 12V VCC = 12V VCC = 12V VCC = 12V VCC = 12V 1.80 1.50 1.00 3.20 2.60 245 450 -400 3.00 2.00 2.40 A A V V V V V V V ns TA = 0C to +85C TA = -40C to +85C TA = 0C to +85C TA = -40C to +85C 9.35 8.35 7.35 6.35 9.80 9.80 7.60 7.60 10.00 10.00 8.00 8.00 V V V V
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ISL6612, ISL6613
Electrical Specifications
PARAMETER UGATE Rise Time LGATE Rise Time UGATE Fall Time LGATE Fall Time UGATE Turn-On Propagation Delay (Note 4) LGATE Turn-On Propagation Delay (Note 4) UGATE Turn-Off Propagation Delay (Note 4) LGATE Turn-Off Propagation Delay (Note 4) LG/UG Three-State Propagation Delay (Note 4) OUTPUT (Note 4) Upper Drive Source Current Upper Drive Source Impedance Upper Drive Sink Current Upper Drive Transition Sink Impedance Upper Drive DC Sink Impedance Lower Drive Source Current Lower Drive Source Impedance Lower Drive Sink Current Lower Drive Sink Impedance OVER TEMPERATURE SHUTDOWN Thermal Shutdown Setpoint Thermal Recovery Setpoint NOTE: 4. Guaranteed by design. Not 100% tested in production. 150 108 C C IU_SOURCE VPVCC = 12V, 3nF Load 1.25 0.9 0.85 0.60 1.25 2.0 2 1.3 1.65 2 1.25 3 0.80 3.0 2.2 3.0 2.2 1.35 A A A A Recommended Operating Conditions, Unless Otherwise Noted. (Continued) SYMBOL tRU tRL tFU tFL tPDHU tPDHL tPDLU tPDLL tPDTS TEST CONDITIONS VPVCC = 12V, 3nF Load, 10% to 90% VPVCC = 12V, 3nF Load, 10% to 90% VPVCC = 12V, 3nF Load, 90% to 10% VPVCC = 12V, 3nF Load, 90% to 10% VPVCC = 12V, 3nF Load, Adaptive VPVCC = 12V, 3nF Load, Adaptive VPVCC = 12V, 3nF Load VPVCC = 12V, 3nF Load VPVCC = 12V, 3nF Load MIN TYP 26 18 18 12 10 10 10 10 10 MAX UNITS ns ns ns ns ns ns ns ns ns
RU_SOURCE 150mA Source Current IU_SINK VPVCC = 12V, 3nF Load
RU_SINK_TR 70ns with Respect to PWM Falling RU_SINK_DC 150mA Source Current IL_SOURCE VPVCC = 12V, 3nF Load
RL_SOURCE 150mA Source Current IL_SINK RL_SINK VPVCC = 12V, 3nF Load 150mA Sink Current
Functional Pin Description
PACKAGE PIN # SOIC 1 2 DFN 1 2 PIN SYMBOL UGATE BOOT FUNCTION Upper gate drive output. Connect to gate of high-side power N-Channel MOSFET. Floating bootstrap supply pin for the upper gate drive. Connect the bootstrap capacitor between this pin and the PHASE pin. The bootstrap capacitor provides the charge to turn on the upper MOSFET. See "Internal Bootstrap Device" on page 8 for guidance in choosing the capacitor value. No Connection. The PWM signal is the control input for the driver. The PWM signal can enter three distinct states during operation; see "Three-State PWM Input" on page 7 for further details. Connect this pin to the PWM output of the controller. Bias and reference ground. All signals are referenced to this node. It is also the power ground return of the driver. Lower gate drive output. Connect to gate of the low-side power N-Channel MOSFET. Connect this pin to a +12V bias supply. Place a high quality low ESR ceramic capacitor from this pin to GND. This pin supplies power to both upper and lower gate drives in ISL6613; only the lower gate drive in ISL6612. Its operating range is +5V to 12V. Place a high quality low ESR ceramic capacitor from this pin to GND. Connect this pin to the SOURCE of the upper MOSFET and the DRAIN of the lower MOSFET. This pin provides a return path for the upper gate drive. Connect this pad to the power ground plane (GND) via thermally enhanced connection.
3 4 5 6 7 8 9
3, 8 4 5 6 7 9 10 11
N/C PWM GND LGATE VCC PVCC PHASE PAD
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FN9153.8 February 26, 2007
ISL6612, ISL6613 Description
1.5VtPDHU
tPDLU tPDTS
tTSSHD tPDTS
UGATE
tRU
tFU
LGATE tFL tPDLL tPDHL tRL tTSSHD
FIGURE 1. TIMING DIAGRAM
Operation
Designed for versatility and speed, the ISL6612 and ISL6613 MOSFET drivers control both high-side and low-side N-Channel FETs of a half-bridge power train from one externally provided PWM signal. Prior to VCC exceeding its POR level, the Pre-POR overvoltage protection function is activated; the upper gate (UGATE) is held low and the lower gate (LGATE), controlled by the Pre-POR overvoltage protection circuits, is connected to the PHASE. Once the VCC voltage surpasses the VCC Rising Threshold (see "Electrical Specifications" on page 5), the PWM signal takes control of gate transitions. A rising edge on PWM initiates the turn-off of the lower MOSFET (see Timing Diagram). After a short propagation delay [tPDLL], the lower gate begins to fall. Typical fall times [tFL] are provided in "Electrical Specifications" on page 5. Adaptive shoot-through circuitry monitors the PHASE voltage and determines the upper gate delay time [tPDHU]. This prevents both the lower and upper MOSFETs from conducting simultaneously. Once this delay period is complete, the upper gate drive begins to rise [tRU] and the upper MOSFET turns on. A falling transition on PWM results in the turn-off of the upper MOSFET and the turn-on of the lower MOSFET. A short propagation delay [tPDLU] is encountered before the upper gate begins to fall [tFU]. Again, the adaptive shoot-through circuitry determines the lower gate delay time, tPDHL. The PHASE voltage and the UGATE voltage are monitored, and the lower gate is allowed to rise after PHASE drops below a level or the voltage of UGATE to PHASE reaches a level depending upon the current direction (See the following section for details). The lower gate then rises [tRL], turning on the lower MOSFET.
Advanced Adaptive Zero Shoot-Through Deadtime Control (Patent Pending)
These drivers incorporate a unique adaptive deadtime control technique to minimize deadtime, resulting in high efficiency from the reduced freewheeling time of the lower MOSFETs' body-diode conduction, and to prevent the upper and lower MOSFETs from conducting simultaneously. This is accomplished by ensuring either rising gate turns on its MOSFET with minimum and sufficient delay after the other has turned off. During turn-off of the lower MOSFET, the PHASE voltage is monitored until it reaches a -0.2V/+0.8V trip point for a forward/reverse current, at which time the UGATE is released to rise. An auto-zero comparator is used to correct the rDS(ON) drop in the phase voltage preventing from false detection of the -0.2V phase level during rDS(ON conduction period. In the case of zero current, the UGATE is released after 35ns delay of the LGATE dropping below 0.5V. During the phase detection, the disturbance of LGATE's falling transition on the PHASE node is blanked out to prevent falsely tripping. Once the PHASE is high, the advanced adaptive shoot-through circuitry monitors the PHASE and UGATE voltages during a PWM falling edge and the subsequent UGATE turn-off. If either the UGATE falls to less than 1.75V above the PHASE or the PHASE falls to less than +0.8V, the LGATE is released to turn on.
Three-State PWM Input
A unique feature of these drivers and other Intersil drivers is the addition of a shutdown window to the PWM input. If the PWM signal enters and remains within the shutdown window for a set holdoff time, the driver outputs are disabled and both MOSFET gates are pulled and held low. The shutdown state is removed when the PWM signal moves outside the shutdown window. Otherwise, the PWM rising and falling thresholds (outlined in "Electrical Specifications" on page 5) determine when the lower and upper gates are enabled.
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ISL6612, ISL6613
This feature helps prevent a negative transient on the output voltage when the output is shut down, eliminating the Schottky diode that is used in some systems for protecting the load from reversed output voltage events. In addition, more than 400mV hysteresis also incorporates into the three-state shutdown window to eliminate PWM input oscillations due to the capacitive load seen by the PWM input through the body diode of the controller's PWM output when the power-up and/or power-down sequence of bias supplies of the driver and PWM controller are required. As an example, suppose two IRLR7821 FETs are chosen as the upper MOSFETs. The gate charge, QG, from the data sheet is 10nC at 4.5V (VGS) gate-source voltage. Then the QGATE is calculated to be 53nC for UVCC (i.e. PVCC in ISL6613, VCC in ISL6612) =12V. We will assume a 200mV droop in drive voltage over the PWM cycle. We find that a bootstrap capacitance of at least 0.267F is required.
1.6 1.4 1.2 CBOOT_CAP (F) 1.0 0.8 0.6 QGATE = 100nC 0.4 50nC 0.2 20nC 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0
Power-On Reset (POR) Function
During initial startup, the VCC voltage rise is monitored. Once the rising VCC voltage exceeds 9.8V (typically), operation of the driver is enabled and the PWM input signal takes control of the gate drives. If VCC drops below the falling threshold of 7.6V (typically), operation of the driver is disabled.
Pre-POR Overvoltage Protection
Prior to VCC exceeding its POR level, the upper gate is held low and the lower gate is controlled by the overvoltage protection circuits during initial startup. The PHASE is connected to the gate of the low side MOSFET (LGATE), which provides some protection to the microprocessor if the upper MOSFET(s) is shorted during initial startup. For complete protection, the low side MOSFET should have a gate threshold well below the maximum voltage rating of the load/microprocessor. When VCC drops below its POR level, both gates pull low and the Pre-POR overvoltage protection circuits are not activated until VCC resets.
0.0 0.0
VBOOT_CAP (V)
FIGURE 2. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE VOLTAGE
Gate Drive Voltage Versatility
The ISL6612 and ISL6613 provide the user flexibility in choosing the gate drive voltage for efficiency optimization. The ISL6612 upper gate drive is fixed to VCC [+12V], but the lower drive rail can range from 12V down to 5V depending on what voltage is applied to PVCC. The ISL6613 ties the upper and lower drive rails together. Simply applying a voltage from 5V up to 12V on PVCC sets both gate drive rail voltages simultaneously.
Internal Bootstrap Device
Both drivers feature an internal bootstrap schottky diode. Simply adding an external capacitor across the BOOT and PHASE pins completes the bootstrap circuit. The bootstrap function is also designed to prevent the bootstrap capacitor from overcharging due to the large negative swing at the trailing-edge of the PHASE node. This reduces voltage stress on the boot to phase pins. The bootstrap capacitor must have a maximum voltage rating above UVCC + 5V and its capacitance value can be chosen from the following equation:
Q GATE C BOOT_CAP ------------------------------------V BOOT_CAP Q G1 * UVCC Q GATE = ----------------------------------- * N Q1 V GS1
Over-Temperature Protection (OTP)
When the junction temperature of the IC exceeds +150C (typically), both upper and lower gates turn off. The driver stays off and does not return to normal operation until its junction temperature comes down below +108C (typically). For high frequency applications, applying a lower voltage to PVCC helps reduce the power dissipation and lower the junction temperature of the IC. This method reduces the risk of tripping OTP.
(EQ. 1)
Power Dissipation
Package power dissipation is mainly a function of the switching frequency (fSW), the output drive impedance, the external gate resistance, and the selected MOSFET's internal gate resistance and total gate charge. Calculating the power dissipation in the driver for a desired application is critical to ensure safe operation. Exceeding the maximum allowable power dissipation level will push the IC beyond the maximum recommended operating junction temperature of +125C. The
where QG1 is the amount of gate charge per upper MOSFET at VGS1 gate-source voltage and NQ1 is the number of control MOSFETs. The VBOOT_CAP term is defined as the allowable droop in the rail of the upper gate drive.
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ISL6612, ISL6613
maximum allowable IC power dissipation for the SO8 package is approximately 800mW at room temperature, while the power dissipation capacity in the EPSOIC and DFN packages, with an exposed heat escape pad, is more than 2W and 1.5W, respectively. Both EPSOIC and DFN packages are more suitable for high frequency applications. See "Layout Considerations" on page 9 for thermal transfer improvement suggestions. When designing the driver into an application, it is recommended that the following calculation is used to ensure safe operation at the desired frequency for the selected MOSFETs. The total gate drive power losses due to the gate charge of MOSFETs and the driver's internal circuitry and their corresponding average driver current can be estimated using Equation 2 and Equation 3, respectively,
P Qg_TOT = P Qg_Q1 + P Qg_Q2 + I Q * VCC Q G1 * UVCC 2 P Qg_Q1 = -------------------------------------- * F SW * N Q1 V GS1 Q G2 * LVCC 2 P Qg_Q2 = ------------------------------------- * F SW * N Q2 V GS2 Q G1 * UVCC * NQ1 Q G2 * LVCC * N Q2 I DR = ----------------------------------------------------- + ---------------------------------------------------- * F SW + I Q V GS1 V GS2 (EQ. 3) (EQ. 2)
CGD RHI2 RLO2 G RG2 RGI2 CGS S Q2 CDS UVCC BOOT D CGD RHI1 RLO1 G RG1 RGI1 CGS S PHASE Q1 CDS
FIGURE 3. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
LVCC D
FIGURE 4. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
Layout Considerations
For heat spreading, place copper underneath the IC whether it has an exposed pad or not. The copper area can be extended beyond the bottom area of the IC and/or connected to buried copper plane(s) with thermal vias. This combination of vias for vertical heat escape, extended copper plane, and buried planes for heat spreading allows the IC to achieve its full thermal potential. Place each channel power component as close to each other as possible to reduce PCB copper losses and PCB parasitics: shortest distance between DRAINs of upper FETs and SOURCEs of lower FETs; shortest distance between DRAINs of lower FETs and the power ground. Thus, smaller amplitudes of positive and negative ringing are on the switching edges of the PHASE node. However, some space in between the power components is required for good airflow. The traces from the drivers to the FETs should be kept short and wide to reduce the inductance of the traces and to promote clean drive signals.
where the gate charge (QG1 and QG2) is defined at a particular gate to source voltage (VGS1and VGS2) in the corresponding MOSFET datasheet; IQ is the driver's total quiescent current with no load at both drive outputs; NQ1 and NQ2 are number of upper and lower MOSFETs, respectively; UVCC and LVCC are the drive voltages for both upper and lower FETs, respectively. The IQ*VCC product is the quiescent power of the driver without capacitive load and is typically 116mW at 300kHz. The total gate drive power losses are dissipated among the resistive components along the transition path. The drive resistance dissipates a portion of the total gate drive power losses, the rest will be dissipated by the external gate resistors (RG1 and RG2) and the internal gate resistors (RGI1 and RGI2) of MOSFETs. Figures 3 and 4 show the typical upper and lower gate drives turn-on transition path. The power dissipation on the driver can be roughly estimated as:
P DR = P DR_UP + P DR_LOW + I Q * VCC R LO1 R HI1 P Qg_Q1 P DR_UP = -------------------------------------- + --------------------------------------- * --------------------2 R HI1 + R EXT1 R LO1 + R EXT1 R LO2 R HI2 P Qg_Q2 P DR_LOW = -------------------------------------- + --------------------------------------- * --------------------R HI2 + R EXT2 R LO2 + R EXT2 2 R GI1 R EXT1 = R G1 + ------------N
Q1
R GI2 R EXT2 = R G2 + ------------N
Q2
(EQ. 4)
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FN9153.8 February 26, 2007
ISL6612, ISL6613 Dual Flat No-Lead Plastic Package (DFN)
2X 0.15 C A A D 2X 0.15 C B
L10.3x3
10 LEAD DUAL FLAT NO-LEAD PLASTIC PACKAGE MILLIMETERS SYMBOL A A1 MIN 0.80 0.18 1.95 1.55 0.25 0.30 NOMINAL 0.90 0.20 REF 0.23 3.00 BSC 2.00 3.00 BSC 1.60 0.50 BSC 0.35 10 5 0.40 1.65 2.05 0.28 MAX 1.00 0.05 NOTES 5,8 7,8 7,8 8 2 3 Rev. 3 6/04 NOTES: 1. Dimensioning and tolerancing conform to ASME Y14.5-1994. 2. N is the number of terminals. 3. Nd refers to the number of terminals on D. 4. All dimensions are in millimeters. Angles are in degrees. 5. Dimension b applies to the metallized terminal and is measured between 0.15mm and 0.30mm from the terminal tip. 6. The configuration of the pin #1 identifier is optional, but must be located within the zone indicated. The pin #1 identifier may be either a mold or mark feature. 7. Dimensions D2 and E2 are for the exposed pads which provide improved electrical and thermal performance. 8. Nominal dimensions are provided to assist with PCB Land Pattern Design efforts, see Intersil Technical Brief TB389.
E 6 INDEX AREA TOP VIEW B
A3 b D D2 E E2
0.10 C
e k L N Nd
A 0.08 C C SEATING PLANE SIDE VIEW A3
7 (DATUM B) 6 INDEX AREA (DATUM A) 1 2 D2
8
D2/2 NX k E2 E2/2
NX L N 8 N-1 NX b e (Nd-1)Xe REF. BOTTOM VIEW 5 0.10 M C A B
C L 0.415 NX (b) 5 SECTION "C-C" C NX b (A1) 0.200 L NX L e CC TERMINAL TIP
FOR ODD TERMINAL/SIDE
10
FN9153.8 February 26, 2007
ISL6612, ISL6613 Small Outline Exposed Pad Plastic Packages (EPSOIC)
N INDEX AREA E -B1 2 3 H 0.25(0.010) M BM
M8.15B
8 LEAD NARROW BODY SMALL OUTLINE EXPOSED PAD PLASTIC PACKAGE INCHES SYMBOL A A1
TOP VIEW
MILLIMETERS MIN 1.43 0.03 0.35 0.19 4.80 3.31 MAX 1.68 0.13 0.49 0.25 4.98 3.39 NOTES 9 3 4 5 6 7 8 2.387 2.387 11 11 Rev. 3 6/05
MIN 0.056 0.001 0.0138 0.0075 0.189 0.150
MAX 0.066 0.005 0.0192 0.0098 0.196 0.157
B
L SEATING PLANE
C D E
h x 45o
-A-
D -C-
A
e H
0.050 BSC 0.230 0.010 0.016 8 0 8 0.094 0.094 0.244 0.016 0.035
1.27 BSC 5.84 0.25 0.41 8 0 6.20 0.41 0.64
A1 0.10(0.004) C
h L N
e
B 0.25(0.010) M SIDE VIEW C AM BS
P P1
NOTES:
1 2 3
1. Symbols are defined in the "MO Series Symbol List" in Section 2.2 of Publication Number 95.
P1
2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension "D" does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. Dimension "E" does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. 6. "L" is the length of terminal for soldering to a substrate. 7. "N" is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width "B", as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch). 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact. 11. Dimensions "P" and "P1" are thermal and/or electrical enhanced variations. Values shown are maximum size of exposed pad within lead count and body size.
N P BOTTOM VIEW
11
FN9153.8 February 26, 2007
ISL6612, ISL6613 Small Outline Plastic Packages (SOIC)
N INDEX AREA E -B1 2 3 SEATING PLANE -AD -CA h x 45 H 0.25(0.010) M BM
M8.15 (JEDEC MS-012-AA ISSUE C)
8 LEAD NARROW BODY SMALL OUTLINE PLASTIC PACKAGE INCHES SYMBOL A A1
L
MILLIMETERS MIN 1.35 0.10 0.33 0.19 4.80 3.80 5.80 0.25 0.40 8 8 0 8 MAX 1.75 0.25 0.51 0.25 5.00 4.00 6.20 0.50 1.27 NOTES 9 3 4 5 6 7 Rev. 1 6/05
MIN 0.0532 0.0040 0.013 0.0075 0.1890 0.1497 0.2284 0.0099 0.016 8 0
MAX 0.0688 0.0098 0.020 0.0098 0.1968 0.1574 0.2440 0.0196 0.050
B C D E e H
C
A1 0.10(0.004)
0.050 BSC
1.27 BSC
e
B 0.25(0.010) M C AM BS
h L N
NOTES: 1. Symbols are defined in the "MO Series Symbol List" in Section 2.2 of Publication Number 95. 2. Dimensioning and tolerancing per ANSI Y14.5M-1982. 3. Dimension "D" does not include mold flash, protrusions or gate burrs. Mold flash, protrusion and gate burrs shall not exceed 0.15mm (0.006 inch) per side. 4. Dimension "E" does not include interlead flash or protrusions. Interlead flash and protrusions shall not exceed 0.25mm (0.010 inch) per side. 5. The chamfer on the body is optional. If it is not present, a visual index feature must be located within the crosshatched area. 6. "L" is the length of terminal for soldering to a substrate. 7. "N" is the number of terminal positions. 8. Terminal numbers are shown for reference only. 9. The lead width "B", as measured 0.36mm (0.014 inch) or greater above the seating plane, shall not exceed a maximum value of 0.61mm (0.024 inch). 10. Controlling dimension: MILLIMETER. Converted inch dimensions are not necessarily exact.
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems. Intersil Corporation's quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
For information regarding Intersil Corporation and its products, see www.intersil.com 12
FN9153.8 February 26, 2007

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